Nu Instruments | Eliminating Doubly Charged Ion Interferences with High Resolution ICP-MS

Interferences caused by doubly charged ions have historically limited the accuracy of ICP-MS measurements, particularly when high concentrations of matrix elements are present. Conventional approaches often rely on minimising doubly charged species through instrument tuning and method optimisation.

The Attom ES uses high-resolution mass separation to physically resolve analyte peaks from interfering doubly charged ions. This enables accurate elemental quantification without the analytical compromises associated with unresolved interferences.

Performance testing using gallium and barium solutions demonstrated that high-resolution and pseudo-resolution methods maintained consistent isotope ratio results even as interference levels increased. The study highlights how interference removal improves both analytical accuracy and confidence in reported data.

Key Takeaways:

• Physically resolves doubly charged ion interferences.
• Improves isotope ratio accuracy and quantitative analysis.
• Reduces dependence on specialised interference suppression methods.