Nu Instruments | Nanoparticle Analysis with Ionic Background Signals Using Attom ES
This application note explores nanoparticle analysis where ionic background signals are present. It shows how Attom ES and Nu Quant support peak detection, background correction and reporting of particle and ionic content.
Ionic background signals can make nanoparticle ICP-MS analysis more difficult by reducing the distinction between particle events and background noise. Accurate processing must separate transient particle peaks from continuous ionic signals.
Attom ES acquires single ion data at dwell times of 20 μs to 50 μs without interruption. Nu Quant smooths the data and applies peak detection criteria based on peak width and background noise statistics.
The method enables particle peak integration with background subtraction, allowing particle size to be reported alongside ionic background content. A single calibration in de-ionised water can be applied to samples with different ionic background levels.
Key Takeaways:
- Nu Quant helps distinguish nanoparticle peaks from ionic background signals.
- Background correction supports more accurate particle size reporting.
- Reports can include particle size, particle concentration and ionic content.
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