Nu Instruments | Extending Nanoparticle Concentration Range Using Attom ES
This application note explains how Attom ES and Nu Quant extend nanoparticle concentration measurement capability. It focuses on fast acquisition, flexible peak detection and quality criteria for high particle event rates.
Traditional nanoparticle ICP-MS workflows often limit measured particle rates to reduce coincidence errors. Fixed integration windows can also misrepresent split or overlapping particle events, especially at higher concentrations.
Attom ES acquires data with dwell times as low as 10 μs, helping distinguish split events and closely spaced particles. Nu Quant then detects peak starts, maxima and endpoints using smoothed data and flexible integration criteria.
The application note reports linear calibration to more than 500 particles per second. Even at >530 measured particles per second, measured particle coincidence was reported as <0.5%, supporting wider concentration range analysis.
Key Takeaways:
- Attom ES supports high particle event rates with fast acquisition.
- Nu Quant identifies partially resolved and potentially coincident peaks.
- Linear calibration was demonstrated beyond traditional concentration limits.
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