Nu Instruments | Extending Nanoparticle Size Range Analysis Using Attom ES

This application note shows how Attom ES extends the measurable size range for nanoparticle analysis. It combines fast acquisition, low detector dead time and attenuation options to improve dynamic range.

Showing the effect of dead time on the level of signal correction required at higher count rates.

Short dwell times improve nanoparticle signal-to-background performance, but they can limit dynamic range because each count represents a high equivalent count rate. This can restrict the range of particle sizes measurable in one analysis.


Attom ES addresses this with fast 10 μs acquisition, low detector dead time and high count rate capability. Slit attenuation and detector attenuation can further extend the usable counting range for larger particles.


The application note shows that calibration across particle sizes is possible even at fast dwell times. It also demonstrates that attenuation methods can return consistent particle size results while expanding the measurable size range.

Attom HR ICP-MS Instrument

Key Takeaways:

  • Fast acquisition and low dead time improve nanoparticle size range.
  • Slit and detector attenuation extend dynamic range for larger particles.
  • Nu Quant supports accurate integration across varied nanoparticle sizes.
Man adjusts part of mass spec instrument

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