Nu Instruments | Pin vs Flat Cell Geometries in GD-MS for Aluminium Analysis
This application note compares pin cell and flat cell geometries for aluminium analysis using the Astrum GD-MS. It demonstrates comparable performance between both approaches and highlights the instrument’s flexibility for analysing bulk materials, high purity foils and ultrathin samples.
Aluminium is widely used across industries, from construction to semiconductors, and requires precise impurity analysis at every stage of production. This study highlights the Astrum GD-MS system and its ability to use both pin and flat cell geometries. This allows analysis across many sample types, including solids, powders and foils.
A comparative study using certified aluminium reference material showed strong agreement between pin and flat cell methods. The results were typically within 30% of certified values, demonstrating reliable performance. The same relative sensitivity factor dataset could be applied to both approaches, simplifying workflows.
The Astrum also delivers strong performance for high purity and ultrathin materials. Trace contaminants were detected at ppb and sub-ppb levels in 6N aluminium foil. Stable and reproducible analysis of a 2 μm thinfoil highlights the versatility of the low-flow glow discharge source design.
Key Takeaways:
- Pin and flat cell geometries provide comparable and reliable analytical results.
- Astrum detects trace impurities at ppb and sub-ppb levels in high purity aluminium.
- Ultrathin foils can be analysed accurately due to the low-flow GD source design.
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