Nu Instruments | Chemical Purity Analysis of Advanced Alumina Using Astrum GD-MS
This application note explores the use of high-resolution glow-discharge mass spectrometry (GD-MS) for analysing high purity alumina and sapphire. It demonstrates accurate, sub-ppm detection of trace impurities using the Astrum system with specialised sample handling. The results highlight consistency with certified reference materials and strong analytical performance for insulating materials.
High purity aluminium oxide is widely used in advanced ceramics, semiconductor manufacturing and composite materials due to its low dielectric constant and high electrical resistivity. As demand for higher-grade materials increases, precise impurity detection becomes critical. This application note examines how the Astrum GD-MS instrument supports accurate purity determination in these materials.
The study evaluates CRM alumina powder and high purity sapphire wafers using a specially designed tantalum sample holder. This approach enables the analysis of insulating materials, which are traditionally challenging for GD-MS. Careful preparation and verification of the sample holder ensures contamination-free measurements and reliable results.
Findings show that Astrum GD-MS delivers consistent, accurate results at sub-ppm levels, closely matching certified reference values. Improvements in instrument design, including reduced background levels and enhanced resolution, enable detection of a wide range of elements, including trace and ultra-trace impurities. This demonstrates the versatility of the system for advanced material characterisation.
Key Takeaways:
- Astrum GD-MS enables accurate sub-ppm impurity detection in alumina and sapphire materials.
- Specialised sample holders allow reliable analysis of non-conductive, insulating samples.
- Results closely match certified reference values, confirming analytical precision and consistency.
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