Nu Instruments | Measurement of High Purity Metals Using astrum GD-MS

The demand for ultra-high purity metals continues to grow, driven by semiconductor manufacturing and aerospace applications. These industries require strict control of trace impurities, often at sub mg/kg levels. GD‑MS remains one of the few techniques capable of detecting such low concentrations directly in solid metal samples.

A common challenge in GD‑MS analysis is the “memory effect”, where residues from a previous sample affect subsequent measurements. This study evaluates the Nu Astrum GD‑MS by analysing high purity copper, followed by zinc, and then re‑analysing the copper after a simple cleaning step. The results demonstrate consistent impurity levels before and after switching samples.

The findings show that a short cleaning procedure of the glow discharge cell effectively restores low background levels. The Astrum system delivers low detection limits comparable to established instruments while reducing contamination risks and maintenance requirements. This makes it well suited for routine ultra-trace analysis in high purity materials. 

Key Takeaways:

• The astrum GD‑MS detects ultra-trace impurities in high purity metals at very low concentration levels.
• A simple glow discharge cell cleaning step minimises memory effects between different sample matrices.
• The system offers reliable performance with low maintenance and minimal contamination risk.