Upgrade kits for Plasma ICP-MS

Enhanced Sensitivity Interface

  • Maximized intermediate vacuum 
  • Enhanced transfer optics
  • Minimal effect on oxide levels
  • Significantly improved sensitivity
  • Uncompromised analytical performance

Software Switchable Pre-amplifiers

  • Selected preamplifiers each can be fitted with two resistors of various sizes (1010Ω, 1011Ω, 1012Ω), in order to enlarge the dynamic range of the chosen Faraday detectors
  • The 1012Ω resistor is suitable for detecting smaller beams with a higher signal to noise ratio. The 1010Ω resistor is suitable for larger beams
  • Fast switching between different resistor values using the software without breaking the pre-amplifier housing vacuum 

Daly Upgrade

  • Larger dynamic range
  • Better gain stability
  • Larger linear range
  • Wider peak flat
  • Longer life time

Low Sulphur Upgrade

  • Low sulphur gas panel and tubings are offered to significantly reduce the instrument sulphur background making it more suitable for low-level sulphur analysis
  • Uncompromised analytical performance without any side effect on other isotope systems

Dry Pump Upgrade

  • The compact 110 m3/h air-cooled Edwards nXLi110 dry pump improves pumping efficiency and generates ca. 10% sensitivity enhancement without elevating the oxide formation or inducing any non-linear mass bias behaviour.
  • Reduces the frequency of preventative maintenance. 
  • Eliminates the formation of hydrocarbon molecules and therefore the background counts for actinides.

High Mass IC Upgrade

  • Ideal for U-Pb geochronology, low level B and Li isotope measurements

P3 Source Upgrade

  • Enhanced Sensitivity Interface.
  • All new innovative torch box design allowing easy connection of a wide range of sample introduction devices.
  • Robust water-cooled 3rd generation RF Generator with frequency tuning, delivers rapid response to changing matrix conditions Improved RF shielding
  • Easy access to expansion chamber front plate for exchanging of cones 
  • Maximum stability and reliability